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patient melanoma tumor mitotic mitotic rate sn tumor burden survival study thickness cancer burden prognostic sentinel center tumor thickness lymph factor oncol analysis tumor mitotic rate table mitose ann surg oncol number follow-up american prognostic factor .001 ulceration breslow thickness stage oncology oncology information downloaded rotterdam breslow rotterdam criteria information american society stages i disease result warsaw metastase cutaneous melanoma multivariate analysis society signi author value dissection sub-micrometastase erasmus mc non-sn positivity medische bibliotheek prognostic factors multivariate survival bene fit criteria thompson akkooi mihm jr vernon k cutaneou survival rate ii disease method positivity group multicenter study jeffrey e martin c ajcc melanoma 5- year berlin trial non-sn mitotic rate assessment lymph node dissection br j surg van akkooi
3 Most Recent Publications
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The analysis of the outcomes and factors related to iliac-obturator involvement in cutaneous melanoma patients after lymph node dissection due to positive sentinel lymph node biopsy or clinically detected inguinal metastases
(Article)
Zdzienicki, M. Rutkowski, P. Eggermont, A.M.M. Nowecki, Z.I. Akkooi, A.C.J. van Michej, W. Dziewirski, W. Świtaj, T. Pieńkowski, A. Sałamacha, M. Bylina, E. |
2013-03-01
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Prognosis in patients with sentinel node - positive melanoma is accurately defined by the combined Rotterdam tumor load and dewar topography criteria
(Article)
Ploeg, A.P.T. van der Akkooi, A.C.J. van Van Leeuwen, P.A.M. Voit, C. Cataldo, F. Testori, A. Roberts, W.C. Hoekstra, H.J. Verhoef, C. Spatz, A. Eggermont, A.M.M. Rutkowski, P. Nowecki, Z.I. Michej, W. Mitra, A. Newton-Bishop, J.A. Cook, M. Nieweg, O.E. Van Den Hout, M.F.C.M. |
2011-06-01
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Sentinel node tumor burden according to the rotterdam criteria is the most important prognostic factor for survival in melanoma patients: A multicenter study in 388 ratients with positive sentinel nodes
(Article)
Alexander, C.J. Nowecki, Z.I. Voit, C. Schäfer-Hesterberg, G. Michej, W. Wilt, J.H.W. de Rutkowski, P. Verhoef, C. Eggermont, A.M.M. |
2008-12-01
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